This Precise Spring Test Probe Model PL75-J1
Experience exceptional accuracy with this this model PL75-J1 spring test probe, designed to ensure reliable electrical contact during circuit testing. Crafted with a sleek, cylindrical gold-colored body, this probe blends durability with aesthetic appeal. Its smooth surface and compact size—measuring 33.35mm in length with a 1.02mm diameter—provide comfortable handling and ease of use. The small, round nickel tips with a diameter of 0.74mm gleam against the gold finish, creating a striking visual contrast while ensuring excellent conductivity. The spring mechanism delivers a steady force of 20 grams at an 8.35mm stroke, allowing consistent contact on circuit boards. With options for customized spring forces up to 250g, this probe offers versatile testing solutions in professional electronic environments.
Key features of this model PL75-J1 test probe
- This model PL75-J1 features a gold-colored cylindrical body with a smooth finish, measuring 33.35mm in length and 1.02mm in diameter, offering durability and a refined look for precision testing.
- The small, round nickel tip of 0.74mm diameter provides stable, scratch-free contact, with a surface coating for enhanced conductivity and longevity, suitable for testing circuit pads, pots, and fingers.
- Its spring mechanism exerts a base force of 20g at full stroke, with adjustable options available up to 250g, making it adaptable for various testing conditions and circuit types.
- Technical specifications include a hole drilling diameter of 1.40mm and a contact grid of 1.91mm, supporting a rated current of 2A and a contact resistance of just 50 milliohms, ideal for sensitive electronic measurements.
- The probe's surface is nickel-plated, ensuring durability, corrosion resistance, and high conductivity, complemented by support for customizable spring forces such as 60g, 90g, 200g, and 250g.
- Compatible with a variety of receptacles, this non-elastic support probe is perfect for electrical testing stations, offering ease of replacement and extended lifespan for your testing setup.
Get this model PL75-J1 test probe now for precise, reliable circuit testing
Enhance your electronic testing setup with this high-quality model PL75-J1 spring test probe. Its elegant design, technical precision, and customizable spring forces make it invaluable for professionals who demand accuracy and durability. By incorporating this probe into your workflow, you'll enjoy consistent testing performance and extended test station longevity. Trust in this reliable component—your perfect partner for complex circuit diagnostics and maintenance. Upgrade your toolkit today and experience the difference precision makes!















