This sleek P125-J0.6 spring test probe enhances your testing precision
Experience reliable performance with this meticulously designed P125-J0.6 spring test probe. Its elegant metallic finish showcases a combination of shiny gold and silver tones, creating a modern, high-quality aesthetic. Measuring 33.35mm in length with a 2.02mm barrel diameter, it features a fine, polished pin of 1.7mm or 0.6mm diameter, perfect for seamless connections. The probe’s rounded or bullet-nosed tip, coated with nickel over brass or copper, ensures durability and high conductivity. Its compact size and smooth surfaces enable precise contact with test points, aiding in efficient circuit testing and troubleshooting. The sleek, polished look combined with technical reliability makes this probe an essential addition to your electronic testing toolkit. Its customizable spring force options—65g, 280g, or 350g—provide versatility for different testing needs, supporting up to 3A current capacity and a contact resistance of 50mΩ.
Keys features of the P125-J0.6 spring test probe
- The probe's overall length is 33.35mm with a barrel diameter of 2.02mm, crafted from high-quality metallic material offering durability and a polished aesthetic.
- The tip features a nickel-coated brass or copper full-radius bullet-nosed or straight-up round head, measuring 0.6mm or 1.7mm, designed for precise, scratch-free contact.
- Supports hole drilling diameters of 2.4mm and a grid spacing of 3.18mm, compatible with multiple receptacles for flexible testing setups and easy probe replacement.
- Standard spring force is 180g supporting a working stroke of 6.35mm, with adjustable options at 65g, 280g, and 350g for customized pressure according to your testing requirements.
- The probes handle a rated current of 3A, with a low contact resistance of approximately 50mΩ, ensuring stable and reliable electrical connections during testing.
- Compatible with a variety of receptacles and used extensively for circuit board testing, electronic debugging, and component validation, providing consistent results and durability.
Elevate your testing with this premium P125-J0.6 probe — buy now!
This high-performance spring test probe is your trusted partner for all electronic testing tasks. Its premium materials and customizable features promise longevity and accuracy. Whether you're working on complex circuit troubleshooting or routine PCB testing, this probe delivers. Its sleek, polished appearance not only looks professional but also ensures reliable, noise-free contact. Invest in this versatile tool to streamline your testing process and achieve precise results every time. With flexible spring force options and a durable construction, this probe is an indispensable component of your electronic testing arsenal. Don't miss out—enhance your testing setup today for faster, more accurate diagnostics.















